R. Y. Li
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1983–1983
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1983 | ITC | Power Supply Noise Testing of VLSI Chips. | R. Y. Li, S. C. Diehl, S. Harrison |