Ren Kothe
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
9
Venues
3
Active years
2005–2010
Best venue rank
C
Where they publish
Papers
9 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2010 | DSD | Test Data and Power Reductions for Transition Delay Tests for Massive-Parallel Scan Structures. | Ren Kothe, Heinrich Theodor Vierhaus |
| 2008 | DSD | Embedded Diagnostic Logic Test Exploiting Regularity. | Heinrich Theodor Vierhaus, Ren Kothe |
| 2007 | DDECS | Flip-Flops and Scan-Path Elements for Nanoelectronics. | Ren Kothe, Heinrich Theodor Vierhaus |
| 2007 | IOLTS | A Configurable Modular Test Processor and Scan Controller Architecture. | R. Frost, D. Rudolph, Christian Galke, Ren Kothe, Heinrich Theodor Vierhaus |
| 2006 | DDECS | Hardware/Software Based Hierarchical Self Test for SoCs. | Ren Kothe, Christian Galke, Sabine Schultke, Henry Frschke, Steffen Gaede, Heinrich Theodor Vierhaus |
| 2006 | DDECS | Embedded Self Repair by Transistor and Gate Level Reconfiguration. | Ren Kothe, Heinrich Theodor Vierhaus, Torsten Coym, Wolfgang Vermeiren, Bernd Straube |
| 2006 | IOLTS | Embedded Scan Test with Diagnostic Features for Self-Testing SoCs. | Christian Galke, Ren Kothe, Sabine Schultke, K. Winkler, Jeanette Honko, Heinrich Theodor Vierhaus |
| 2006 | IOLTS | Built-in Self Repair by Reconfiguration of FPGAs. | S. Habermann, Ren Kothe, Heinrich Theodor Vierhaus |
| 2005 | IOLTS | A Multi-Purpose Concept for SoC Self Test Including Diagnostic Features. | Ren Kothe, Christian Galke, Heinrich Theodor Vierhaus |