Rex Kiang
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1992–1992
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1992 | ITC | An Analysis of the Die Testing Process Using Taguchi Techniques and Circuit Diagnostics. | Robert Trahan, Rex Kiang |