Richard Kacprowicz
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
2006–2008
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2008 | DATE | Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs. | Sudarshan Bahukudumbi, Krishnendu Chakrabarty, Richard Kacprowicz |
| 2006 | ITC | Optimizing the Cost of Test at Intel Using per Device Data. | Robert Edmondson, Gregory Iovino, Richard Kacprowicz |