Robert Baumann
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2003–2003
Best venue rank
C
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2003 | IOLTS | Technology Scaling Trends and Accelerated Testing for Soft Errors in Commercial Silicon Devices. | Robert Baumann |