Robert W. Atherton
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
7
Venues
2
Active years
1983–1990
Best venue rank
A
Where they publish
Papers
7 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1990 | WSC | Detailed simulation for semiconductor manufacturing. | Robert W. Atherton, Linda F. Atherton, Mark Pool |
| 1986 | ITC | Financial Impact of Tester Reliability Improvements. | Judith E. Dayhoff, Robert W. Atherton |
| 1985 | ITC | Microprocessor Speed Optimization Using Pattern-Recognition Analysis of Parametric Test Data. | Robert W. Atherton, John L. Mudge |
| 1985 | ITC | Financial Implications of a Detailed Analysis of Test Floor Operations. | Judith E. Dayhoff, Robert W. Atherton |
| 1984 | ITC | Logic Device Characterization Using Computer-Aided Test and Analysis. | Robert W. Atherton, Leonard Ekkelkamp, Chuck Schmitz |
| 1983 | ITC | Use of In-Fab Parametric Testing for Process Control of Semiconductor Manufacturing. | Robert W. Atherton, David M. Campbell |
| 1983 | ITC | Operations Management and Analysis in the Management of Electronic Testing. | Robert W. Atherton, Alfred H. Miller Jr., Judith E. Dayhoff |