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Rouwaida Kanj

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

21

Venues

5

Active years

2002–2024

Best venue rank

A*

Where they publish

Papers

21 indexed papers, newest first.

YearVenueTitleAuthors
2024ISCASReconfigurable Precision SRAM-based Analog In-memory-compute Macro Design.Jinane Bazzi, Rachid Jamil, Dana El Hajj, Rouwaida Kanj, Mohammed E. Fouda, Ahmed M. Eltawil
2023ISCASHardware Acceleration of DNA Pattern Matching with Binary Memristors.Jinane Bazzi, Mohammed E. Fouda, Rouwaida Kanj, Ahmed M. Eltawil
2023ISCASScalable Complementary FeFET CAM Design.Omar Bekdache, Hadi Noureddine, Mohamad Al Tawil, Rouwaida Kanj, Mohamed E. Fouda, Ahmed M. Eltawil
2022ISCAS1T1R In-Memory Compute for Winner Takes All Application in Kohonen Neural Networks.Aya Mouallem, Hussein Fadlallah, Lina Bacha, Dana El Hajj, Rachid Jamil, Dana Bazazo, Rouwaida Kanj
2021ISCASImportance Splitting Sample Point Reuse for Efficient Memory Yield Estimation.Mariam Rakka, Rouwaida Kanj
2020ISCASHybrid Importance Splitting Importance Sampling Methodology for Fast Yield Analysis of Memory Designs.Mariam Rakka, Rouwaida Kanj, Ragheb Raad
2019ISCASData Imbalance Handling Approaches for Accurate Statistical Modeling and Yield Analysis of Memory Designs.Lama Shaer, Rouwaida Kanj, Rajiv V. Joshi
2013VLSIDHardware-corroborated Variability-Aware SRAM Methodology.Rajiv V. Joshi, Rouwaida Kanj, S. Butt, Emrah Acar, Dallas Lea, D. Sciacca
2012DACYield estimation via multi-cones.Rouwaida Kanj, Rajiv V. Joshi, Zhuo Li, Jerry Hayes, Sani R. Nassif
2012ICCADA thermal and process variation aware MTJ switching model and its applications in soft error analysis.Peiyuan Wang, Wei Zhang, Rajiv V. Joshi, Rouwaida Kanj, Yiran Chen
2011ICCADUniversal statistical cure for predicting memory loss.Rajiv V. Joshi, Rouwaida Kanj, Peiyuan Wang, Hai Li
2011ICCADAccelerated statistical simulation via on-demand Hermite spline interpolations.Rouwaida Kanj, Tong Li, Rajiv V. Joshi, Kanak Agarwal, Ali Sadigh, David Winston, Sani R. Nassif
2010ISLPEDStatistical leakage modeling for accurate yield analysis: the CDF matching method and its alternatives.Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif
2010VLSIDFinFET SRAM Design.Rajiv V. Joshi, Keunwoo Kim, Rouwaida Kanj
2009ICCADYield estimation of SRAM circuits using "Virtual SRAM Fab".Aditya Bansal, Rama N. Singh, Rouwaida Kanj, Saibal Mukhopadhyay, Jin-Fuw Lee, Emrah Acar, Amith Singhee, Keunwoo Kim, Ching-Te Chuang, Sani R. Nassif, Fook-Luen Heng, Koushik K. Das
2009ICCADAn elegant hardware-corroborated statistical repair and test methodology for conquering aging effects.Rouwaida Kanj, Rajiv V. Joshi, Chad Adams, James D. Warnock, Sani R. Nassif
2008ISLPEDSRAM methodology for yield and power efficiency: per-element selectable supplies and memory reconfiguration schemes.Rouwaida Kanj, Rajiv V. Joshi, Zhuo Li, Jente B. Kuang, Hung C. Ngo, Nancy Ying Zhou, Weiping Shi, Sani R. Nassif
2007ISLPEDA floating-body dynamic supply boosting technique for low-voltage sram in nanoscale PD/SOI CMOS technologies.Rajiv V. Joshi, Rouwaida Kanj, Keunwoo Kim, Richard Q. Williams, Ching-Te Chuang
2006DACMixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events.Rouwaida Kanj, Rajiv V. Joshi, Sani R. Nassif
2004DACNoise characterization of static CMOS gates.Rouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum
2002ISCASA critical look at design guidelines for SOI logic gates.Rouwaida Kanj, Elyse Rosenbaum