Roy Haley
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1994–1994
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1994 | VTS | Correlating defect level to final test fault coverage for modular structured designs [microcontroller family]. | Theo J. Powell, Kenneth M. Butler, Mike Ales, Roy Haley, Mark Perry |