Rung-Chuan Lin
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2006–2006
Best venue rank
A*
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2006 | ICRA | A Virtual Metrology Scheme for Predicting CVD Thickness in Semiconductor Manufacturing. | Tung-Ho Lin, Min-Hsiung Hung, Rung-Chuan Lin, Fan-Tien Cheng |