Ryuichi Takagi
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1985–1989
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1989 | ITC | A 250 MHz Shared-Resource VLSI Test System with High Pin Count and Memory Test Capability. | Shuji Kikuchi, Yoshihiko Hayashi, Takashi Matsumoto, Ryozou Yoshino, Ryuichi Takagi |
| 1985 | ITC | Custom VLSI Test System. | Ryozou Yoshino, Ryuichi Takagi |