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S. Cremoux

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

1996–1996

Best venue rank

National

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
1996VTSA new test pattern generation method for delay fault testing.S. Cremoux, Christophe Fagot, Patrick Girard, Christian Landrault, Serge Pravossoudovitch