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Saket Goyal

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

2025–2025

Best venue rank

A

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
2025ITCIn-Field Testing using In-System Embedded Deterministic Test as a solution to alleviate Silent Data Corruption in AI designs.Varun Sehgal, Subramanian Mahadevan, Ashrith S. Harith, Mohit Sharma, Saket Goyal, Nilanjan Mukherjee