Salvatore R. Vecchio
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
1
Active years
1985–1989
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1989 | ITC | Testing for Coupled Cells in Random-Access Memories. | Jacob Savir, William H. McAnney, Salvatore R. Vecchio |
| 1985 | ITC | Random Pattern Testing for Data-Line Faults in an Embedded Multiport Memory. | Jacob Savir, William H. McAnney, Salvatore R. Vecchio |
| 1985 | ITC | Random Pattern Testing for Address-Line Faults in an Embedded Multiport Memory. | Jacob Savir, William H. McAnney, Salvatore R. Vecchio |