Sanghyeon Baeg
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
4
Venues
3
Active years
1994–2011
Best venue rank
A*
Where they publish
Papers
4 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2011 | DAC | Designing ad-hoc scrubbing sequences to improve memory reliability against soft errors. | Pedro Reviriego, Juan Antonio Maestro, Sanghyeon Baeg |
| 2001 | ITC | AC-JTAG: empowering JTAG beyond testing DC nets. | Sung Soo Chung, Sanghyeon Baeg |
| 1994 | ICCD | A New Test Generation Methodology Using Selective Clocking for the Clock Line Controlled Circuits. | Sanghyeon Baeg, William A. Rogers |
| 1994 | ITC | Hybrid Design for Testability Combining Scan and Clock Line Control and Method for Test Generation. | Sanghyeon Baeg, William A. Rogers |