Shigehiro Funatsu
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
7
Venues
2
Active years
1975–1986
Best venue rank
A*
Where they publish
Papers
7 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1986 | ITC | Test Data Quality Assurance. | Masato Kawai, T. Shimono, Shigehiro Funatsu |
| 1985 | ITC | An AC/DC Test Generation System for Gate Array LSIs. | T. Shimono, K. Oozeki, M. Takahashi, Masato Kawai, Shigehiro Funatsu |
| 1983 | ITC | A High Level Test Pattern Generation Algorithm. | Masato Kawai, Hideo Shibano, Shigehiro Funatsu, Shunichi Kato, T. Kurobe, K. Ookawa, Tohru Sasaki |
| 1981 | ITC | A Calculus of Testability Measure at the Functional Level. | Shigeru Takasaki, Masato Kawai, Shigehiro Funatsu, Akihiko Yamada |
| 1978 | DAC | Automatic System Level Test Generation and Fault Location for Large Digital Systems. | Akihiko Yamada, Nobuo Wakatsuki, T. Fukui, Shigehiro Funatsu |
| 1977 | DAC | Automatic test generation for large digital circuits. | Akihiko Yamada, Nobuo Wakatsuki, Hideo Shibano, Osamu Itoh, Kyoji Tomita, Shigehiro Funatsu |
| 1975 | DAC | Test generation systems in Japan. | Shigehiro Funatsu, Nobuo Wakatsuki, Toshihiro Arima |