Shohei Morishima
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
2
Active years
2005–2007
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2007 | ICCAD | Estimation of delay test quality and its application to test generation. | Seiji Kajihara, Shohei Morishima, Masahiro Yamamoto, Xiaoqing Wen, Masayasu Fukunaga, Kazumi Hatayama, Takashi Aikyo |
| 2006 | ITC | A Framework of High-quality Transition Fault ATPG for Scan Circuits. | Seiji Kajihara, Shohei Morishima, Akane Takuma, Xiaoqing Wen, Toshiyuki Maeda, Shuji Hamada, Yasuo Sato |
| 2005 | ITC | Low-capture-power test generation for scan-based at-speed testing. | Xiaoqing Wen, Yoshiyuki Yamashita, Shohei Morishima, Seiji Kajihara, Laung-Terng Wang, Kewal K. Saluja, Kozo Kinoshita |