Shuichi Kameyama
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1992–2011
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2011 | ITC | Surviving state disruptions caused by test: A case study. | Kenneth P. Parker, Shuichi Kameyama, David Dubberke |
| 1992 | ITC | Interconnect and Delay Testing with a 4800-Pin Board Tester. | Shuichi Kameyama, Hideyuki Ohara, Chihiro Endo, Naoki Takayama |