Sourabh Bhalerao
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2017–2017
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2017 | ITC | Single-pin test control for Big A, little D devices. | Michael Laisne, Hans Martin von Staudt, Sourabh Bhalerao, Mark Eason |