Stefan van den Oetelaar
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
2002–2003
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2003 | ITC | Detection of Resistive Shorts in Deep Sub-micron Technologies. | Bram Kruseman, Stefan van den Oetelaar |
| 2002 | ITC | Comparison of IDDQ Testing and Very-Low Voltage Testing. | Bram Kruseman, Stefan van den Oetelaar, Josep Rius |