Stephen Pateras
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
8
Venues
4
Active years
1988–2004
Best venue rank
A*
Where they publish
Papers
8 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2004 | ITC | Security vs. Test Quality: Fully Embedded Test Approaches Are the Key to Having Both. | Stephen Pateras |
| 2002 | DATE | Embedded Diagnosis IP. | Stephen Pateras |
| 2000 | ITC | Bridging the gap between embedded test and ATE. | Martin Bell, Givargis Danialy, Michael C. Howells, Stephen Pateras |
| 1999 | ITC | An embedded technique for at-speed interconnect testing. | Benoit Nadeau-Dostie, Jean-Francois Cote, Harry Hulvershorn, Stephen Pateras |
| 1995 | ITC | Avoiding Unknown States When Scanning Mutually Exclusive Latches. | Stephen Pateras, Martin S. Schmookler |
| 1991 | DAC | Generation of Correlated Random Patterns for the Complete Testing of Synthesized Multi-level Circuits. | Stephen Pateras, Janusz Rajski |
| 1991 | ITC | Cube-Contained Random Patterns and Their Applications to the Complete Testing of Synthesized Multi-Level Circuits. | Stephen Pateras, Janusz Rajski |
| 1988 | ICCD | A self-reconfiguration scheme for fault-tolerant VLSI processor arrays. | Stephen Pateras, Janusz Rajski |