Steve Butkovich
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
2004–2009
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2009 | ITC | Boundary-scan adoption - an industry snapshot with emphasis on the semiconductor industry. | Philip B. Geiger, Steve Butkovich |
| 2004 | ITC | Production Test Effectiveness of Combined Automated Inspection and ICT Test Strategies. | Amit Verma, Charles Robinson, Steve Butkovich |