| 2014 | ICDCIT | Comparative Improvement of Image Segmentation Performance with Graph Based Method over Watershed Transform Image Segmentation. | Suman Deb, Subarna Sinha |
| 2012 | DAC | Improved tangent space based distance metric for accurate lithographic hotspot classification. | Jing Guo, Fan Yang, Subarna Sinha, Charles C. Chiang, Xuan Zeng |
| 2012 | DAC | Accurate process-hotspot detection using critical design rule extraction. | Yen-Ting Yu, Ya-Chung Chan, Subarna Sinha, Iris Hui-Ru Jiang, Charles C. Chiang |
| 2011 | DAC | A distributed algorithm for layout geometry operations. | Kai-Ti Hsu, Subarna Sinha, Yu-Chuan Pi, Charles C. Chiang, Tsung-Yi Ho |
| 2010 | ASPDAC | Fixed-outline thermal-aware 3D floorplanning. | Linfu Xiao, Subarna Sinha, Jingyu Xu, Evangeline F. Y. Young |
| 2009 | ASPDAC | The road to 3D EDA tool readiness. | Charles C. Chiang, Subarna Sinha |
| 2009 | DATE | Sequential logic rectifications with approximate SPFDs. | Yu-Shen Yang, Subarna Sinha, Andreas G. Veneris, Robert K. Brayton, Duncan Exon Smith |
| 2007 | ASPDAC | Model Based Layout Pattern Dependent Metal Filling Algorithm for Improved Chip Surface Uniformity in the Copper Process. | Subarna Sinha, Jianfeng Luo, Charles C. Chiang |
| 2007 | ICCAD | A methodology for fast and accurate yield factor estimation during global routing. | Subarna Sinha, Charles C. Chiang |
| 2007 | ICCAD | Accurate detection for process-hotspots with vias and incomplete specification. | Jingyu Xu, Subarna Sinha, Charles C. Chiang |
| 2006 | DAC | An IC manufacturing yield model considering intra-die variations. | Jianfeng Luo, Subarna Sinha, Qing Su, Jamil Kawa, Charles C. Chiang |
| 2006 | ICCAD | Efficient process-hotspot detection using range pattern matching. | Hailong Yao, Subarna Sinha, Charles C. Chiang, Xianlong Hong, Yici Cai |
| 2005 | DATE | Bright-Field AAPSM Conflict Detection and Correction. | Charles C. Chiang, Andrew B. Kahng, Subarna Sinha, Xu Xu, Alexander Zelikovsky |
| 2005 | ICCAD | Fast and efficient phase conflict detection and correction in standard-cell layouts. | Charles C. Chiang, Andrew B. Kahng, Subarna Sinha, Xu Xu |