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Suhas M. Satheesh

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

2022–2022

Best venue rank

National

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
2022VTSOn-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST).Seyed Nima Mozaffari, Bonita Bhaskaran, Shantanu Sarangi, Suhas M. Satheesh, Kuo Lin Fu, Nithin Valentine, P. Manikandan, Mahmut Yilmaz