Sushil K. Malik
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1983–1984
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1984 | ITC | MOS Gate Oxide Quality Control and Reliability Assessment by Voltage Ramping. | Sushil K. Malik, E. F. Chace |
| 1983 | ITC | Future of Temperature and Humidity Testing: Highly Accelerated Temperature and Humidity Stress Test (HAST). | Sushil K. Malik, Jeffrey E. Gunn, Robert E. Camenga |