Takao Nakano
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1985–1985
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1985 | ITC | Test Pattern Considerations for Fault Tolerant High Density DRAM. | Hiroshi Miyamoto, Koichiro Mashiko, Yoshikazu Morooka, Kazutami Arimoto, Michihiro Yamada, Takao Nakano |