Skip to content

Tamlyn Lahoud

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

2024–2024

Best venue rank

C

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
2024FIEWIP: Psychometric Analysis of Electric Circuit Concepts Diagnostic (ECCD) Basic Test Items: A Classical Test Theory Approach.Tamlyn Lahoud, Olanrewaju P. Olaogun, Shiyu Wang, Nathaniel J. Hunsu, Adel Al-Weshah, Kun Yao