Ted R. Lundquist
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
5
Venues
2
Active years
2001–2007
Best venue rank
A
Where they publish
Papers
5 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2007 | ITC | Backside E-Beam Probing on Nano scale devices. | Rudolf Schlangen, Reiner Leihkauf, Uwe Kerst, Christian Boit, Rajesh Jain, Tahir Malik, Keneth R. Wilsher, Ted R. Lundquist, Bernd Krger |
| 2005 | ITC | Impact of back side circuit edit on active device performance in bulk silicon ICs. | Uwe Kerst, Rudolf Schlangen, A. Kabakow, Erwan Le Roy, Ted R. Lundquist, Siegfried Pauthner |
| 2003 | ITC | Fault Localization using Time Resolved Photon Emission and STIL Waveforms. | Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah |
| 2002 | IPAS | Subresolution placement using IR image to CAD database alignment: an algorithm for silicon-side probing. | Madhumita Sengupta, Lokesh Johri, Chun-Cheng Tsao, Mark Thompson, Ted R. Lundquist |
| 2001 | ITC | Practical, non-invasive optical probing for flip-chip devices. | G. Dajee, Norman Goldblatt, Ted R. Lundquist, Steven Kasapi, Keneth R. Wilsher |