Tek Jau Tan
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2001–2001
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2001 | VTS | Socillator Test: A Delay Test Scheme for Embedded ICs in the Boundary-Scan Environment. | Tek Jau Tan, Chung-Len Lee |