Tom Munns
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
3
Venues
1
Active years
1991–2002
Best venue rank
A
Where they publish
Papers
3 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2002 | ITC | valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits. | John Gatej, Lee Song, Carol Pyron, Rajesh Raina, Tom Munns |
| 1992 | ITC | Implementing 1149.1 on CMOS Microprocessors. | William C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns |
| 1991 | ITC | Implementing 1149.1 on CMOS Microprocessors. | William C. Bruce, Michael G. Gallup, Grady Giles, Tom Munns |