Tom W. Williams
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
5
Venues
2
Active years
1982–1986
Best venue rank
A*
Where they publish
Papers
5 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1986 | ITC | TRIM : Testability Range by Ignoring the Memory. | Leendert M. Huisman, Larry Carter, Tom W. Williams |
| 1986 | ITC | Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials. | Tom W. Williams, Wilfried Daehn, Matthias Gruetzner, Corot W. Starke |
| 1984 | DAC | Chip partitioning aid: A design technique for partitionability and testability in VLSI. | Subrata Dasgupta, M. C. Graf, Robert A. Rasmussen, Ron G. Walther, Tom W. Williams |
| 1984 | ITC | Sufficient Testing In A Self-Testing Environment. | Tom W. Williams |
| 1982 | ITC | A Variation of LSSD and Its Implications on Design and Test Pattern Generation in VLSI. | Sumit DasGupta, Prabhakar Goel, Ron G. Walther, Tom W. Williams |