Toyohito Ikeya
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2000–2000
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2000 | ITC | A BIST approach for very deep sub-micron (VDSM) defects. | Yasuo Sato, Toyohito Ikeya, Michinobu Nakao, Takaharu Nagumo |