V. Moreda
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1997–1997
Best venue rank
National
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1997 | VTS | An optimized BIST test pattern generator for delay testing. | Patrick Girard, Christian Landrault, V. Moreda, Serge Pravossoudovitch |