Victor Zieren
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1998–1999
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1999 | ITC | Transient current testing of 0.25 μm CMOS devices. | Bram Kruseman, Peter Janssen, Victor Zieren |
| 1998 | ITC | Defect detection with transient current testing and its potential for deep sub-micron CMOS ICs. | Manoj Sachdev, Peter Janssen, Victor Zieren |