Von-Kyoung Kim
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1996–1997
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1997 | ITC | ASIC Manufacturing Test Cost Prediction at Early Design Stage. | Von-Kyoung Kim, Tom Chen, Mick Tegethoff |
| 1996 | ITC | ASIC Yield Estimation at Early Design Cycle. | Von-Kyoung Kim, Mick Tegethoff, Tom Chen |