Walter C. Riordan
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2001–2001
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2001 | ITC | Unit level predicted yield: a method of identifying high defect density die at wafer sort. | Russell B. Miller, Walter C. Riordan |