| 2013 | DAC | Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data. | Fa Wang, Wangyang Zhang, Shupeng Sun, Xin Li, Chenjie Gu |
| 2013 | DAC | Automatic clustering of wafer spatial signatures. | Wangyang Zhang, Xin Li, Sharad Saxena, Andrzej J. Strojwas, Rob A. Rutenbar |
| 2013 | ITC | Test data analytics - Exploring spatial and test-item correlations in production test data. | Chun-Kai Hsu, Fan Lin, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, John M. Carulli, Kenneth M. Butler |
| 2012 | ICCAD | Efficient parametric yield estimation of analog/mixed-signal circuits via Bayesian model fusion. | Xin Li, Wangyang Zhang, Fa Wang, Shupeng Sun, Chenjie Gu |
| 2012 | ICCAD | A dynamic method for efficient random mismatch characterization of standard cells. | Wangyang Zhang, Amith Singhee, Jinjun Xiong, Peter A. Habitz, Amol Joshi, Chandu Visweswariah, James Sundquist |
| 2011 | ASPDAC | Parallel statistical capacitance extraction of on-chip interconnects with an improved geometric variation model. | Wenjian Yu, Chao Hu, Wangyang Zhang |
| 2011 | ICCAD | Toward efficient spatial variation decomposition via sparse regression. | Wangyang Zhang, Karthik Balakrishnan, Xin Li, Duane S. Boning, Rob A. Rutenbar |
| 2011 | ITC | Test cost reduction through performance prediction using virtual probe. | Hsiu-Ming Chang, Kwang-Ting Cheng, Wangyang Zhang, Xin Li, Kenneth M. Butler |
| 2010 | DAC | Toward efficient large-scale performance modeling of integrated circuits via multi-mode/multi-corner sparse regression. | Wangyang Zhang, Tsung-Hao Chen, Ming Yuan Ting, Xin Li |
| 2010 | DAC | Bayesian virtual probe: minimizing variation characterization cost for nanoscale IC technologies via Bayesian inference. | Wangyang Zhang, Xin Li, Rob A. Rutenbar |
| 2010 | ICCAD | Multi-Wafer Virtual Probe: Minimum-cost variation characterization by exploring wafer-to-wafer correlation. | Wangyang Zhang, Xin Li, Emrah Acar, Frank Liu, Rob A. Rutenbar |
| 2009 | DAC | Variational capacitance extraction of on-chip interconnects based on continuous surface model. | Wenjian Yu, Chao Hu, Wangyang Zhang |
| 2008 | DATE | An Efficient Method for Chip-Level Statistical Capacitance Extraction Considering Process Variations with Spatial Correlation. | Wangyang Zhang, Wenjian Yu, Zeyi Wang, Zhiping Yu, Rong Jiang, Jinjun Xiong |