| 1996 | ITC | Improving Gate Level Fault Coverage by RTL Fault Grading. | Weiwei Mao, Ravi K. Gulati |
| 1994 | ITC | Structure and Metrology for a Single-wire Analog. | Yunsheng Lu, Weiwei Mao, Ramaswami Dandapani, Ravi K. Gulati |
| 1992 | ITC | Detection of "Undetectable" Faults Using I | Ravi K. Gulati, Weiwei Mao, Deepak K. Goel |
| 1992 | ITC | Robustness Enhancement and Detection Threshold Reduction in ATPG for Gate Delay Faults. | Weiwei Mao, Michael D. Ciletti |
| 1991 | DAC | Correlation-Reduced Scan-path Design To Improve Delay Fault Coverage. | Weiwei Mao, Michael D. Ciletti |
| 1990 | DAC | A Variable Observation Time Method for Testing Delay Faults. | Weiwei Mao, Michael D. Ciletti |
| 1990 | ICCAD | QUIETEST: A Quiescent Current Testing Methodology for Detecting Leakage Faults. | Weiwei Mao, Ravi K. Gulati, Deepak K. Goel, Michael D. Ciletti |
| 1990 | ITC | Arrangement of latches in scan-path design to improve delay fault coverage. | Weiwei Mao, Michael D. Ciletti |
| 1989 | DAC | A Simplified Six-waveform Type Method for Delay Fault Testing. | Weiwei Mao, Michael D. Ciletti |
| 1988 | DAC | Dytest: A Self-Learning Algorithm Using Dynamic Testability Measures to Accelerate Test Generation. | Weiwei Mao, Michael D. Ciletti |
| 1986 | DAC | Robust test generation algorithm for stuck-open fault in CMOS circuits. | Weiwei Mao, Xieting Ling |