| 2023 | ASPDAC | Learning Based Spatial Power Characterization and Full-Chip Power Estimation for Commercial TPUs. | Jincong Lu, Jinwei Zhang, Wentian Jin, Sachin Sachdeva, Sheldon X.-D. Tan |
| 2023 | ICCAD | Fast Full-Chip Parametric Thermal Analysis Based on Enhanced Physics Enforced Neural Networks. | Liang Chen, Jincong Lu, Wentian Jin, Sheldon X.-D. Tan |
| 2023 | ICCAD | PostPINN-EM: Fast Post-Voiding Electromigration Analysis Using Two-Stage Physics-Informed Neural Networks. | Subed Lamichhane, Wentian Jin, Liang Chen, Mohammadamir Kavousi, Sheldon X.-D. Tan |
| 2022 | ASPDAC | Fast Thermal Analysis for Chiplet Design based on Graph Convolution Networks. | Liang Chen, Wentian Jin, Sheldon X.-D. Tan |
| 2022 | ICCAD | HierPINN-EM: Fast Learning-Based Electromigration Analysis for Multi-Segment Interconnects Using Hierarchical Physics-Informed Neural Network. | Wentian Jin, Liang Chen, Subed Lamichhane, Mohammadamir Kavousi, Sheldon X.-D. Tan |
| 2021 | DAC | EMGraph: Fast Learning-Based Electromigration Analysis for Multi-Segment Interconnect Using Graph Convolution Networks. | Wentian Jin, Liang Chen, Sheriff Sadiqbatcha, Shaoyi Peng, Sheldon X.-D. Tan |
| 2021 | DATE | Data-Driven Electrostatics Analysis based on Physics-Constrained Deep learning. | Wentian Jin, Shaoyi Peng, Sheldon X.-D. Tan |
| 2021 | VTS | Special Session: Machine Learning for Semiconductor Test and Reliability. | Hussam Amrouch, Animesh Basak Chowdhury, Wentian Jin, Ramesh Karri, Farshad Khorrami, Prashanth Krishnamurthy, Ilia Polian, Victor M. van Santen, Benjamin Tan, Sheldon X.-D. Tan |
| 2020 | DATE | Accurate Power Density Map Estimation for Commercial Multi-Core Microprocessors. | Jinwei Zhang, Sheriff Sadiqbatcha, Wentian Jin, Sheldon X.-D. Tan |
| 2020 | ICCAD | Full-Chip Thermal Map Estimation for Commercial Multi-Core CPUs with Generative Adversarial Learning. | Wentian Jin, Sheriff Sadiqbatcha, Jinwei Zhang, Sheldon X.-D. Tan |
| 2020 | ICCAD | GridNet: Fast Data-Driven EM-Induced IR Drop Prediction and Localized Fixing for On-Chip Power Grid Networks. | Han Zhou, Wentian Jin, Sheldon X.-D. Tan |
| 2020 | ICCD | EM-GAN: Data-Driven Fast Stress Analysis for Multi-Segment Interconnects. | Wentian Jin, Sheriff Sadiqbatcha, Zeyu Sun, Han Zhou, Sheldon X.-D. Tan |