Wern-Yan Koe
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
1989–1989
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1989 | ITC | Test Effectiveness Metrics and CMOS Faults. | Scott F. Midkiff, Wern-Yan Koe |