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William J. Bowhill

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

2

Venues

2

Active years

1998–2015

Best venue rank

A

Where they publish

Papers

2 indexed papers, newest first.

YearVenueTitleAuthors
2015ISLPEDPower management in the Intel Xeon E5 v3.Ankush Varma, William J. Bowhill, Jason Crop, Corey Gough, Brian Griffith, Dan Kingsley, Krishna Sistla
1998ITCA highly testable and diagnosable fabrication process test chip.Dilip K. Bhavsar, Ugonna Echeruo, David R. Akeson, William J. Bowhill