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Wojciech P. Maly

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

3

Venues

1

Active years

1993–1996

Best venue rank

National

Where they publish

Papers

3 indexed papers, newest first.

YearVenueTitleAuthors
1996VTSCan Defect-Tolerant Chips Better Meet the Quality Challenge?R. L. Campbell, P. Kuekes, David Y. Lepejian, Wojciech P. Maly, Michael Nicolaidis, Alex Orailoglu
1993VTSEstimation of reject ratio in testing of combinatorial circuits.Dinesh D. Gaitonde, Jitendra Khare, D. M. H. Walker, Wojciech P. Maly
1993VTSComputer-aided failure analysis of VLSI circuits using ISamir B. Naik, Wojciech P. Maly