Yan-Fu Chen
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2022–2022
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2022 | ITC | Scan-Based Test Chip Design with XOR-based C-testable Functional Blocks. | Yan-Fu Chen, Duo-Yao Kang, Kuen-Jong Lee |