Yeoh Eng Hong
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
1
Active years
1997–1998
Best venue rank
A
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1998 | ITC | High volume microprocessor test escapes, an analysis of defects our tests are missing. | Wayne M. Needham, Cheryl Prunty, Yeoh Eng Hong |
| 1997 | ITC | The Application of Novel Failure Analysis Techniques for Advanced Multi-Layered CMOS Devices. | Yeoh Eng Hong, Martin Tay Tiong We |