Yerong Chen
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
1
Venues
1
Active years
2025–2025
Best venue rank
A
Where they publish
Papers
1 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 2025 | ITC | Scan Strategies for High Quality Latch Array Testing. | Bin Du, Nehal Patel, Yerong Chen, Jeremy Chin, Katherine Tian |