Yi-Nan Shen
Publication record assembled from the DBLP archive of ranked conferences.
Papers indexed
2
Venues
2
Active years
1989–1992
Best venue rank
National
Where they publish
Papers
2 indexed papers, newest first.
| Year | Venue | Title | Authors |
|---|---|---|---|
| 1992 | VTS | Detection of multiple faults in CMOS circuits using a behavioral approach. | Yi-Nan Shen, Fabrizio Lombardi |
| 1989 | ICCAD | Fault detection in a testable PLA with low overhead for production testing. | Yi-Nan Shen, Fabrizio Lombardi |