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Yun-Pan Ho

Publication record assembled from the DBLP archive of ranked conferences.

Papers indexed

1

Venues

1

Active years

1997–1997

Best venue rank

National

Where they publish

Papers

1 indexed papers, newest first.

YearVenueTitleAuthors
1997VLSIDDelay Fault Coverage Enhancement Using Multiple Test Observation Times.Wen-Ben Jone, Yun-Pan Ho, Sunil R. Das