350nm CMOS test-chip for architecture verification of real-time QVGA color-video segmentation at the 90nm technology node.
Takashi Morimoto, Yohmei Harada, Tetsushi Koide, Hans Jrgen Mattausch
Browse the full ASPDAC paper archive.
Takashi Morimoto, Yohmei Harada, Tetsushi Koide, Hans Jrgen Mattausch
Browse the full ASPDAC paper archive.