Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
DAC
/
Paper
Layout aware line-edge roughness modeling and poly optimization for leakage minimization.
Yongchan Ban
,
Jae-Seok Yang
Venue
A*
DAC
Year
2011
Proceedings
DAC
DBLP record
conf/dac/BanY11 ↗
Browse the full
DAC paper archive
.