Skip to content
cs-conference-ranking
.org
By subfield
By rank
Methodology
⌕
Search 971 venues
Home
/
DAC
/
Paper
Random Limited-Scan to Improve Random Pattern Testing of Scan Circuits.
Irith Pomeranz
Venue
A*
DAC
Year
2001
Proceedings
DAC
DBLP record
conf/dac/Pomeranz01 ↗
Browse the full
DAC paper archive
.