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DFM/DFY design for manufacturability and yield - influence of process variations in digital, analog and mixed-signal circuit design.

Markus Bhler, Jrgen Koehl, Jeanne Bickford, Jason Hibbeler, Ulf Schlichtmann, Ralf Sommer, Michael Pronath, Andreas Ripp

VenueADATE
Year2006
ProceedingsDATE

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